Analytical modeling of SiC-MOSFETs for parasitic parameter adjustment based on experimental data
摘要
This paper presents an analytical modeling approach for silicon carbide (SiC) power MOSFETs, focusing on optimizing parasitic parameters to achieve high accuracy with experimental results. Power device modeling combines state-space equations with manufacturer datasheet data to develop a computationally efficient equivalent electrical circuit model that accurately replicates switching behavior. An optimization algorithm refines parasitic parameters, ensuring a strong correlation with experimental data. Validated through MATLAB/Simulink simulations and experimental comparisons, the proposed model demonstrates superior accuracy and significantly reduced computational times relative to traditional SPICE models.