Scholarlink

<p>The importance of understanding the sintering mechanism for Al has increased with the recent development of Al binder jetting technology (BJT). The morphology of eutectic Si is one aspect crucial to understanding this mechanism. Although conventional cross-sectional observation remains the primary method, this approach involves cutting, sectioning, and observing, which is time consuming and yields information from only a single two-dimensional in-plane cross-section. In this study, we explore the possibility that propagation-based X-ray phase-contrast tomography using a laboratory-based X-ray apparatus can enhance image contrast associated with eutectic microstructures. By investigating the influence of propagation distance and X-ray energy conditions on the visibility of eutectic structures, we demonstrate that structures equivalent to those observed by optical microscopy of microstructures and by scanning electron microscopy–energy dispersive X-ray spectrometry (SEM–EDS) can be observed. These verification results demonstrate the feasibility of three-dimensional observation of eutectic Si in sintered Al and indicate that this approach is applicable to the microstructural characterization of eutectic Si in Al components fabricated by BJT, including thin-walled structures and pin fins used in high-performance heat exchangers.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Propagation-based phase-contrast computed tomography using laboratory-based X-ray system for eutectic silicon in aluminum sintered bodies produced by binder jetting

  • 期刊论文

  • 发表日期：

    2026年7月4日

查看全文
  • Daichi Yamaguchi,
  • Naoki Oya

摘要

The importance of understanding the sintering mechanism for Al has increased with the recent development of Al binder jetting technology (BJT). The morphology of eutectic Si is one aspect crucial to understanding this mechanism. Although conventional cross-sectional observation remains the primary method, this approach involves cutting, sectioning, and observing, which is time consuming and yields information from only a single two-dimensional in-plane cross-section. In this study, we explore the possibility that propagation-based X-ray phase-contrast tomography using a laboratory-based X-ray apparatus can enhance image contrast associated with eutectic microstructures. By investigating the influence of propagation distance and X-ray energy conditions on the visibility of eutectic structures, we demonstrate that structures equivalent to those observed by optical microscopy of microstructures and by scanning electron microscopy–energy dispersive X-ray spectrometry (SEM–EDS) can be observed. These verification results demonstrate the feasibility of three-dimensional observation of eutectic Si in sintered Al and indicate that this approach is applicable to the microstructural characterization of eutectic Si in Al components fabricated by BJT, including thin-walled structures and pin fins used in high-performance heat exchangers.