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<p>The study of chip formation, traditionally reliant on the Quick-Stop Device (QSD), faces challenges in preserving the chip root for analysis. This research validates a new experimental procedure to investigate the formation of the built-up edge (BUE), a recurring phenomenon in machining that directly compromises the quality and efficiency of manufacturing processes. BUE forms due to the adhesion of material particles to the cutting tool, altering the cutting configuration and process conditions. To examine this phenomenon, a test specimen with a specific geometry was developed, enabling control over the chip length, with the BUE connected at the end, simulating the conditions of a QSD test in orthogonal cutting. Methodologies applied included macroscopic analysis, micrography, cutting force versus cutting speed curves, and microhardness measurements. The test specimen enabled controlled chip generation, allowing variations in cutting speed, feed rate, and cutting width. The results indicated that the BUE disappears at cutting speeds above 83&#xa0;m/min. BUE was observed at speeds below this threshold, both on the chip’s lower surface and its extremity. Micrographic analysis revealed that most BUEs measured between 0.2 and 0.4&#xa0;mm, accounting for 62% of the BUEs observed in the tests. Microhardness measurements showed an 18% increase in the chip body and an 80% increase in the BUE. It is concluded that the proposed test specimen is an effective and accessible tool for detailed analysis of this phenomenon.</p>

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A new experimental procedure for investigating built-up edge formation through chip analysis in AISI 1050 steel

  • 期刊论文

  • 发表日期：

    2025年6月18日

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  • Reinaldo Clemente Fortes,
  • Igor Cezar Pereira,
  • Gustavo Paulinelli Guimarães,
  • Márcio Bacci Da Silva

摘要

The study of chip formation, traditionally reliant on the Quick-Stop Device (QSD), faces challenges in preserving the chip root for analysis. This research validates a new experimental procedure to investigate the formation of the built-up edge (BUE), a recurring phenomenon in machining that directly compromises the quality and efficiency of manufacturing processes. BUE forms due to the adhesion of material particles to the cutting tool, altering the cutting configuration and process conditions. To examine this phenomenon, a test specimen with a specific geometry was developed, enabling control over the chip length, with the BUE connected at the end, simulating the conditions of a QSD test in orthogonal cutting. Methodologies applied included macroscopic analysis, micrography, cutting force versus cutting speed curves, and microhardness measurements. The test specimen enabled controlled chip generation, allowing variations in cutting speed, feed rate, and cutting width. The results indicated that the BUE disappears at cutting speeds above 83 m/min. BUE was observed at speeds below this threshold, both on the chip’s lower surface and its extremity. Micrographic analysis revealed that most BUEs measured between 0.2 and 0.4 mm, accounting for 62% of the BUEs observed in the tests. Microhardness measurements showed an 18% increase in the chip body and an 80% increase in the BUE. It is concluded that the proposed test specimen is an effective and accessible tool for detailed analysis of this phenomenon.